• DocumentCode
    719970
  • Title

    A chemi-ionization processing approach for characterizing flame flickering behavior

  • Author

    Fangyan Li ; Lijun Xu ; Zhang Cao ; Minglong Du

  • Author_Institution
    Sch. of Instrum. & Opto-Electron. Eng., Beihang Univ., Beijing, China
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    325
  • Lastpage
    329
  • Abstract
    The present work focuses on a new method based on chemi-ionization to measure the flame flickering frequency. The flame flickering behavior was determined using the ion generation rate of the flame, characterized by measuring the saturation current with ion probe. A systematic comparative study was conducted by applying ion probe and other methods, such as flame detector, digital camera in the premixed flame. The flame flickering behavior was described using the frequency spectrum obtained by time series data of different technologies. Results indicate that the chemi-ionization method show excellent ability in measuring flame flickering frequency. Meanwhile, ion signals presented some detailed difference compared to the common technologies. Furthermore, by setting ion probe in different positions of the flame, frequency distribution can be measured and applied to evaluate the degree of non-uniformity and instability of combustion field.
  • Keywords
    combustion; electric current measurement; flames; frequency measurement; ionisation; time series; chemiionization processing approach; combustion; digital camera; flame detector; flame flickering frequency measurement; frequency distribution; ion probe generation rate; ion signal presentation; premixed flame; saturation current measurement; time series; Combustion; Fires; Optical imaging; Optical polarization; Optical sensors; Optical variables measurement; Ultrasonic variables measurement; Flame flicker; chemi-ionization; flame detector; frequency spectrum; ion probe; non-uniform distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151288
  • Filename
    7151288