• DocumentCode
    719972
  • Title

    High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations

  • Author

    Hami, Fahim ; Boulzazen, Habib ; Kadi, Moncef

  • Author_Institution
    Smart Low-Carbon Vehicle & Mobility, VeDeCoM, Versailles, France
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    334
  • Lastpage
    339
  • Abstract
    All types of passive components present variations for most of their electric parameters as a function of several operating conditions (temperature, frequency, voltage). Capacitors, unlike other types of passive components (resistors and coils), are more sensitive to these variations. This paper presents the effects of temperature and bias voltage on power electronic capacitors for frequencies ranging from 10 kHz to 1 GHz. To study these effects, characterization methods and several test benches based on Vector Network Analyzer (VNA) are developed and introduced in this paper. The aim is to be able to predict, by simulation, the frequency behavior of these components under temperature and high bias voltage variations. The range of the applied bias voltage is from 0 Volt up to 1 kVolt and temperature ranging from -40°C up to 140°C. The developed models are then translated to VHDL-AMS languages to facilitate their implementation in various electrical simulators.
  • Keywords
    power capacitors; VHDL-AMS language; electric parameters; frequency 10 kHz to 1 GHz; high bias voltage variation; high frequency characterization; passive components; power electronic capacitors; temperature -40 C to 140 C; temperature variation; vector network analyzer; voltage 0 kV to 1 kV; Capacitors; Frequency measurement; Impedance; Impedance measurement; Integrated circuit modeling; Temperature measurement; Voltage measurement; Power electronic components; capacitors; frequency measurement; high-voltage techniques; impedance measurement; temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151290
  • Filename
    7151290