• DocumentCode
    719977
  • Title

    Subcutaneous veins depth estimation method using Monte Carlo simulations

  • Author

    Shahzad, A. ; Tyng, Chai Meei ; Saad, N.M. ; Walter, N. ; Malik, Aamir Saeed ; Meriaudeau, F.

  • Author_Institution
    Centre for Intell. Signal & Imaging Res., Univ. Teknol. PETRONAS, Malaysia
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    376
  • Lastpage
    380
  • Abstract
    Subcutaneous veins localization is basic and important step for any intravenous medication administration. Due to different physiological characteristics, mainly darker skin tone, scars or dehydrated condition of patients, medical staff face difficulty in veins localization. Through near infrared imaging technology the veins can be visualized due to high contrast between veins and skin tissue in this modality. Information on the depth of veins is equally important for proper catheterization or venipuncture procedures. Patients have different veins depth due to the different amount of fat present in the subcutaneous layer. The depth of veins from the skin surface cannot be estimated by simple imaging technique. In this paper a mathematical model to estimate the depth of veins based on measured diffused reflectance is presented. A layered model of Monte Carlo simulations for light transport in turbid medium was used to validate the results.
  • Keywords
    Monte Carlo methods; biomedical optical imaging; infrared imaging; light scattering; reflectivity; skin; spatial variables measurement; Monte Carlo simulations; catheterization procedures; darker skin tone condition; dehydrated condition; diffuse reflectance measurement; light transport; near infrared imaging technology; physiological characteristics; scar condition; subcutaneous vein depth estimation method; turbid medium; venipuncture procedures; Biomedical imaging; Mathematical model; Optical reflection; Reflectivity; Skin; Veins; Diffused Reflectance; Intravenous (IV) Catheterization; Monte Carlo; Near Infrared; Subcutaneous Veins;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151297
  • Filename
    7151297