• DocumentCode
    720052
  • Title

    Sub-surface defect detection with motion induced eddy currents in aluminium

  • Author

    Rocha, Tiago ; Ramos, Helena ; Lopes Ribeiro, A. ; Pasadas, Dario

  • Author_Institution
    Inst. de Telecomun., Univ. de Lisboa, Lisbon, Portugal
  • fYear
    2015
  • fDate
    11-14 May 2015
  • Firstpage
    930
  • Lastpage
    934
  • Abstract
    Nondestructive testing in situations where there is a moving media has always been a challenging task. Motion induced eddy current testing is a good solution for testing metallic surfaces, as it does not require contact with the sample. This work presents a method to detect sub-surface defects in non-ferromagnetic material with motion induced eddy currents. A numerical model was used to verify the progression of eddy currents along the depth of a conductive plate and to obtain the magnetic field perturbation in the presence of sub-surface defects. A probe, including a permanent magnet to induce eddy currents and a magnetic sensor was moved in the vicinity of an aluminium plate with sub-surface defects to obtain experimental data and the results compared to those obtained with the numerical model. At higher speeds, the time of diffusion of deeper eddy currents takes, makes it possible to also estimate the depth of a sub-surface defect by measuring how far away the perturbation is from the moving magnet.
  • Keywords
    aluminium; eddy current testing; flaw detection; magnetic sensors; permanent magnets; plates (structures); conductive plate; magnetic field perturbation; magnetic sensor; motion induced eddy current testing; moving magnet; nonferromagnetic material; numerical model; permanent magnet; subsurface defect detection; Aluminum; Current measurement; Eddy currents; Magnetic fields; Magnetic flux; Permanent magnets; Probes; aluminium; eddy current testing; motion; speed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
  • Conference_Location
    Pisa
  • Type

    conf

  • DOI
    10.1109/I2MTC.2015.7151394
  • Filename
    7151394