Title :
Enhanced ADC sine wave histogram test
Author :
Max, Solomon ; Liggiero, Richard
Author_Institution :
LTX-Credence Corp., Norwood, MA, USA
Abstract :
An improved method of testing ADCs with a sine wave histogram is combined with an improved compression algorithm to accurately test the INL and DNL of ADCs. The accuracy of the compression algorithm is demonstrated with actual and simulated results. The role of THD and noise in the accuracy of the measurements is demonstrated. A previously reported method for reducing THD in an ac source is introduced as a method of improving ADC measurement accuracy.
Keywords :
analogue-digital conversion; integrated circuit testing; enhanced ADC sine wave histogram test; Arrays; Filtering; Histograms; Noise; Noise measurement; Testing; Uncertainty; ADC; DNL; Histogram; INL; THD;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151527
