DocumentCode :
720161
Title :
Analyzing numerical optimization problems of finite resolution sine wave fitting algorithms
Author :
Renczes, B. ; Kollar, I. ; Carbone, P. ; Moschitta, A. ; Palfi, V. ; Virosztek, T.
Author_Institution :
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear :
2015
fDate :
11-14 May 2015
Firstpage :
1662
Lastpage :
1667
Abstract :
In this paper the numerical behavior of different sine wave fitting methods is investigated. In addition to the Three- and Four-Parameter Least Squares Fits, also the Maximum Likelihood and the Quantile Based Estimator methods suffer from similar numerical problems that may disturb the result of the ADC test. Suggestions are given in order to improve the performance of the investigated algorithms.
Keywords :
analogue-digital conversion; least squares approximations; maximum likelihood estimation; optimisation; finite resolution; four-parameter least squares fits; maximum likelihood method; numerical optimization problem; quantile based estimator method; sine wave fitting algorithms; three-parameter least squares fits; Digital signal processing; Fitting; Maximum likelihood estimation; Noise; Noise measurement; Quantization (signal); Roundoff errors; Analog-Digital Converter Testing; Least Squares Fit; Maximum Likelihood Method; Numerical Optimization; Quantile Based Estimator; Sine Wave Fitting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
Type :
conf
DOI :
10.1109/I2MTC.2015.7151529
Filename :
7151529
Link To Document :
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