Title :
An extension to IEEE Std. 1241 sine fit for analog-to-information converters testing
Author :
Daponte, Pasquale ; De Vito, Luca ; Rapuano, Sergio
Author_Institution :
Dept. of Eng., Univ. of Sannio, Benevento, Italy
Abstract :
The paper proposes a test method for Analog-to-Information Converters (AICs) in the time domain, by extending the three-parameter sine fit proposed in clause 5.2 of the IEEE Std. 1241. Such method can be easily applied to several AIC architectures, based on random sampling or random demodulation. The proposed method has been validated by simulations and by means of a random sampling AIC architecture. Results of both validation phases are reported and discussed in the paper.
Keywords :
IEEE standards; analogue-digital conversion; circuit testing; AIC architecture; IEEE Std. 1241 extension; analog-to-information converters testing; sine fit; Analytical models; Demodulation; IEEE standards; Reconstruction algorithms; Testing; Time-domain analysis;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location :
Pisa
DOI :
10.1109/I2MTC.2015.7151577
