DocumentCode
720199
Title
An extension to IEEE Std. 1241 sine fit for analog-to-information converters testing
Author
Daponte, Pasquale ; De Vito, Luca ; Rapuano, Sergio
Author_Institution
Dept. of Eng., Univ. of Sannio, Benevento, Italy
fYear
2015
fDate
11-14 May 2015
Firstpage
1933
Lastpage
1937
Abstract
The paper proposes a test method for Analog-to-Information Converters (AICs) in the time domain, by extending the three-parameter sine fit proposed in clause 5.2 of the IEEE Std. 1241. Such method can be easily applied to several AIC architectures, based on random sampling or random demodulation. The proposed method has been validated by simulations and by means of a random sampling AIC architecture. Results of both validation phases are reported and discussed in the paper.
Keywords
IEEE standards; analogue-digital conversion; circuit testing; AIC architecture; IEEE Std. 1241 extension; analog-to-information converters testing; sine fit; Analytical models; Demodulation; IEEE standards; Reconstruction algorithms; Testing; Time-domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2015 IEEE International
Conference_Location
Pisa
Type
conf
DOI
10.1109/I2MTC.2015.7151577
Filename
7151577
Link To Document