Title :
Effect of Eddy Currents on Method for Evaluating Shielding Performance of Magnetically Shielded Rooms Using Exciting Coil
Author :
Muramatsu, Kazuhiro ; Yanhui Gao ; Yoneyama, Yuta ; Sakai, Akihiko ; Yuuki, Satoshi ; Kazami, Kunio ; Yamazaki, Kinya ; Shinnoh, Toshifumi ; Yamaguchi, Toru ; Shimada, Masanobu
Author_Institution :
Dept. of Electr. & Electron. Eng., Saga Univ., Saga, Japan
Abstract :
The standard of Japan Electronics and Information Technology Industries Association EM-4502, in which the shielding factor (SFo) of magnetically shielded rooms (MSRs) for the uniform magnetic field can be estimated using coils within 10% error for the extremely low-frequency region of <;1 Hz without eddy current effects, has been already published. In this paper, to establish standard methods for evaluating SF for low-frequency region using coils, the effects of the setting method, size, and distance from MSR of the coils on SF are investigated by a linear eddy current analysis of an actual MSR made of copper and permalloy plates. It is shown that the coil should be placed in front of the door, and a much larger estimation error than 10% should be permitted for practical use in a standardization to estimate SFo for low frequency. Moreover, a method of estimating not only SFo but SFs as well when the noise source is close to MSR should be added in a standardization.
Keywords :
Permalloy; coils; copper; eddy currents; electromagnetic shielding; plates (structures); standards; Japan Electronics and Information Technology Industries Association EM-4502; coils; copper; eddy currents effect; exciting coil; linear eddy current analysis; magnetically shielded rooms; noise source; permalloy plates; shielding factor; shielding performance; standard methods; standardization; uniform magnetic field; Coils; Current measurement; Eddy currents; Magnetic noise; Magnetic shielding; Noise; Standardization; Eddy currents; exciting coil; magnetic field analysis; magneticallyshielded room (MSR); shielding factor (SF);
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2014.2330870