DocumentCode :
720603
Title :
Naturalized Communication and Testing
Author :
Roncken, Marly ; Gilla, Swetha Mettala ; Hoon Park ; Jamadagni, Navaneeth ; Cowan, Chris ; Sutherland, Ivan
Author_Institution :
Asynchronous Res. Center, Portland State Univ., Portland, OR, USA
fYear :
2015
fDate :
4-6 May 2015
Firstpage :
77
Lastpage :
84
Abstract :
We "naturalize" the handshake communication links of a self-timed system by assigning the capabilities of filling and draining a link and of storing its full or empty status to the link itself. This contrasts with assigning these capabilities to the joints, the modules connected by the links, as was previously done. Under naturalized communication, the differences between Micropipeline, GasP, Mousetrap, and Click circuits are seen only in the links -- the joints become identical; past, present, and future link and joint designs become interchangeable. We also "naturalize" the actions of a self-timed system, giving actions status equal to states -- for the purpose of silicon test and debug. We partner traditional scan test techniques dedicated to state with new test capabilities dedicated to action. To each and every joint, we add a novel proper-start-stop circuit, called MrGO, that permits or forbids the action of that joint. MrGO, pronounced "Mister GO," makes it possible to (1) exit an initial state cleanly to start circuit operation in a delay-insensitive manner, (2) stop a running circuit in a clean and delay-insensitive manner, (3) single- or multi-step circuit operations for test and debug, and (4) test sub-systems at speed.
Keywords :
integrated circuit design; integrated circuit testing; monolithic integrated circuits; timing circuits; GasP circuits; Mister GO; Mousetrap circuits; MrGO; click circuits; handshake communication links; micropipeline circuits; multistep circuit operations; naturalized communication; proper-start-stop circuit; scan test techniques; self-timed system; silicon debug; silicon test; single-step circuit operations; Clocks; Joints; Latches; Pipelines; Testing; Throughput; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asynchronous Circuits and Systems (ASYNC), 2015 21st IEEE International Symposium on
Conference_Location :
Mountain View, CA
ISSN :
1522-8681
Type :
conf
DOI :
10.1109/ASYNC.2015.20
Filename :
7152694
Link To Document :
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