Title :
Connectivity-based error evaluation for ellipse fitting
Author :
Masuzaki, Tomonari ; Sugaya, Yasuyuki
Author_Institution :
Dept. of Comput. Sci. & Eng., Toyohashi Univ. of Technol., Toyohashi, Japan
Abstract :
We propose a new method for fitting an ellipse to a point sequence extracted from an image. This method can fit an ellipse if a point sequence consists of elliptic arcs and non-elliptic arcs such as line segments. Assuming that input points are spatially connected, we iteratively select inlier points and fit an ellipse to them by computing curvatures of the residual graph. By using simulated data and real images, we compare the performance of our method with existing methods and show that the accuracy and computation time of the proposed method is superior to existing methods.
Keywords :
curve fitting; image sequences; connectivity-based error evaluation; ellipse fitting; elliptic arcs; inlier points; line segments; point sequence; residual graph; Accuracy; Computational modeling; Computer vision; Image edge detection; Image segmentation; Noise; Standards;
Conference_Titel :
Machine Vision Applications (MVA), 2015 14th IAPR International Conference on
Conference_Location :
Tokyo
DOI :
10.1109/MVA.2015.7153147