Title :
Reciprocating surface grinding of semiconductor wafers: A kinematic model for grinding marks & pattern
Author :
Qi Zhang ; Zhichao Li
Author_Institution :
Sch. of Mech. Eng., Yangzhou Univ., Yangzhou, China
Abstract :
Reciprocating surface grinding is one of state-of-the-art machining processes to flatten semiconductor wafers to obtain a better surface roughness and grinding marks uniformity. In this paper, a kinematic model is developed to study the grinding marks pattern resulted from the reciprocating surface grinding. The model is then utilized to simulate the grinding marks and compared with rotary surface grinding. Experiments are also conducted to verify the simulation results.
Keywords :
grinding; machining; semiconductor technology; grinding mark pattern; kinematic model; machining process; reciprocating surface grinding; rotary surface grinding; semiconductor wafer; Clocks; Machining; Semiconductor device modeling;
Conference_Titel :
Semiconductor Technology International Conference (CSTIC), 2015 China
Conference_Location :
Shanghai
DOI :
10.1109/CSTIC.2015.7153418