Title :
Automated test platform for FPGA Software Validation
Author :
Shixiao Yan ; Yu Zhao ; Ping Chen
Author_Institution :
Lattice Semicond. (Shanghai) Co., Ltd., China
Abstract :
The paper introduces one powerful and easy to use test platform which is developed and applied in FPGA (Field Program Gate Array) Software Validation. The complete solution of the test platform can manage thousands of test cases in various FPGA flows to execute launching run, checking results and generating reports automatically on multiple client machines simultaneously. The maximum efficiency of machine usage and significant engineering time saving are obtained based on this automated test platform. Some benchmarking data are given at the end of the paper.
Keywords :
automatic testing; field programmable gate arrays; integrated circuit testing; program verification; FPGA software validation; automated test platform; field programmable gate array; machine usage; multiple client machine; Industries; Monitoring; Real-time systems;
Conference_Titel :
Semiconductor Technology International Conference (CSTIC), 2015 China
Conference_Location :
Shanghai
DOI :
10.1109/CSTIC.2015.7153445