DocumentCode :
72099
Title :
Analyzing Transient Phenomena in the Time Domain Using the Feature Selective Validation (FSV) Method
Author :
Jauregui, Ricardo ; Gang Zhang ; Rojas-Mora, Julio ; Ventosa, Oriol ; Silva, Francisco ; Duffy, Alistair P. ; Sasse, Hugh
Author_Institution :
Dept. d´Eng. Electron., Univ. Politec. de Catalunya, Barcelona, Spain
Volume :
56
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
825
Lastpage :
834
Abstract :
The increasing application of simulation tools to increasingly complex problems makes the use of validation tools essential to improve confidence in the veracity of those simulation results. IEEE Standard 1597.1 is the first true standard for the validation of computational electromagnetics method. This standard uses the feature selective validation (FSV) method as the key quantification tool. However, despite its many advantages, there have been some interesting issues surrounding the validation of transients. This paper presents a new approach to the validation of a set of generally representative transient types using the FSV method and shows how the previously experienced limitations can be overcome. In order to analyze the main parameters associated with transient comparison, a survey which included 20 experts was conducted. This information was used to identify the significant regions that need to be taken into account in the transient comparison. Finally, using the statistics obtained by the experts, a new solution was defined and its improvement over the existing approach was demonstrated.
Keywords :
IEEE standards; computational electromagnetics; feature selection; statistical analysis; time-domain analysis; transient analysis; FSV method; IEEE Standard 1597.1; computational electromagnetics method; feature selective validation; statistics; time domain analysis; transient phenomena analysis; Computational modeling; Computer applications; Electromagnetic measurements; Feature extraction; Simuilation; Transient analysis; Computational electromagnetics method (CEM); computer simulation; data comparison; feature selective validation (FSV) method; numerical simulation; transient; validation;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2013.2246167
Filename :
6518138
Link To Document :
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