• DocumentCode
    721186
  • Title

    Design of Vedic multiplier for high fault coverage and comparative analysis with conventional multipliers

  • Author

    Gujamagadi, Pavan ; Sankolli, Pramod R. ; Kumar V, Praveen ; Nayak B, Raghavendra ; Palecha, Namita ; Suma, M.S.

  • Author_Institution
    Dept. of Electron. & Commun., RV Coll. of Eng., Bangalore, India
  • fYear
    2015
  • fDate
    12-13 June 2015
  • Firstpage
    738
  • Lastpage
    742
  • Abstract
    Multipliers are the major contributors to the overall throughput in most SoCs. Vedic arithmetic is a novel and simplified approach to perform complex operations. Any good design must be targeted for optimal Speed-Area Trade-off. Commercial application demands reliable and economical design which makes testability an important parameter. Stuck-at-fault model for the design is to be developed and proper metrics have to be used to measure testability. Good design implies high fault coverage also. In this paper, design of Vedic multiplier with high fault coverage is proposed. Vedic multiplier designed using Urdhva-Triyagbhyam Sutra operates faster than the conventional multipliers like Booth and Array multipliers. Comparative analysis of VLSI parameters such as throughput, area and fault coverage is done with other multipliers.
  • Keywords
    VLSI; logic design; multiplying circuits; system-on-chip; SoC; Urdhva-Triyagbhyam Sutra; VLSI parameter; Vedic multiplier; array multiplier; booth multiplier; comparative analysis; conventional multiplier; high fault coverage; speed-area trade-off; stuck-at-fault model; testability; Arrays; Automatic test pattern generation; Circuit faults; Conferences; Delays; Reliability; System-on-chip; Fault Coverage; Speed-Area Trade-off; Stuck-at-fault; Urdhva-Triyagbhyam Sutra; Vedic arithmetic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advance Computing Conference (IACC), 2015 IEEE International
  • Conference_Location
    Banglore
  • Print_ISBN
    978-1-4799-8046-8
  • Type

    conf

  • DOI
    10.1109/IADCC.2015.7154805
  • Filename
    7154805