Strain-mediated voltage control of a Ni/NiO spontaneous exchange bias (SEB) system

Author

Sun, W. ; Carman, G.

Author_Institution

Mech. & Aerosp. Eng., Univ. of California Los Angeles, Los Angeles, CA, USA

fYear

2015

fDate

11-15 May 2015

Firstpage

1

Lastpage

1

Abstract

Exchange bias refers to magnetic anisotropy from coupled antiferromagnetic - ferromagnetic (AFM-FM) systems due to interfacial exchange effects. Electric control of exchange bias provides an additional degree of freedom for designing next-generation magnetic memory and logic devices. Control of conventional exchange bias (CEB), using both charge and strain mediated effects, has been previously demonstrated in the literature, but similar control of spontaneous exchange bias (SEB), a related phenomenon, has not been previously studied. The purpose of this presentation is to explore electrical control of SEB.

Keywords

antiferromagnetic materials; exchange interactions (electron); ferromagnetic materials; interface magnetism; magnetic anisotropy; nickel; nickel compounds; Ni-NiO; Ni-NiO spontaneous exchange bias system; charge mediated effect; conventional exchange bias control; coupled antiferromagnetic-ferromagnetic systems; degree of freedom; electric control; interfacial exchange effects; logic device; magnetic anisotropy; magnetic memory device; spontaneous exchange bias control; strain mediated effect; strain-mediated voltage control; Crystals; Electric fields; Frequency modulation; Magnetic anisotropy; Magnetic fields; Nickel; Strain;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference (INTERMAG), 2015 IEEE

Conference_Location

Beijing

Print_ISBN

978-1-4799-7321-7

Type

conf

DOI

10.1109/INTMAG.2015.7156537

Filename

7156537