Influence of perpendicular magnetic field on angular dependent exchange bias of [Co/Pd]5/CoFeB Electrodes

Author

Zhang, Q. ; Yu, T. ; Naganuma, H. ; Shi, D. ; Han, X.

Author_Institution

State Key Lab. of Magn., Inst. of Phys., Beijing, China

fYear

2015

fDate

11-15 May 2015

Firstpage

1

Lastpage

1

Abstract

In this paper, we studied training effect and in-plane exchange bias in [Co/Pd]₅/CoFeB system with ultrathin CoFeB film (t<;2 nm) . Magnetic multilayers with the composition of Ta(5)/Ru(5)/[Co(0 .2)/Pd(1 .0)]₅ /CoFeB(t =0, 1, 1 .5, 2)/MgO(2.5)/Ta(5) (thickness in nm) were deposited at room temperature on a thermal oxide silicon substrate by rf magnetron sputtering. Training effect and exchange-bias were investigated by vibrating sample magnetometer (VSM).

Keywords

boron alloys; cobalt alloys; electrodes; exchange interactions (electron); iron alloys; magnesium compounds; magnetic field effects; magnetic multilayers; palladium alloys; ruthenium; sputter deposition; tantalum; SiO; Ta-Ru-(CoPd)₅-CoFeB-MgO-Ta; angular dependent exchange bias; electrodes; in-plane exchange bias; magnetic multilayers; perpendicular magnetic field; rf magnetron sputtering; size 0.2 nm to 5 nm; temperature 293 K to 298 K; thermal oxide silicon substrate; training effect; ultrathin film; vibrating sample magnetometer; Magnetic domains; Magnetic fields; Magnetic hysteresis; Magnetic multilayers; Magnetic tunneling; Magnetometers; Perpendicular magnetic anisotropy;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference (INTERMAG), 2015 IEEE

Conference_Location

Beijing

Print_ISBN

978-1-4799-7321-7

Type

conf

DOI

10.1109/INTMAG.2015.7156581

Filename

7156581