Nd-Fe-B film magnets with the thickness above 100 μm deposited on Si substrates

Author

Chikuba, Y. ; Oryoshi, M. ; Yamashita, A. ; Nakano, M. ; Yanai, T. ; Fukunaga, H.

Author_Institution

Nagasaki Univ., Nagasaki, Japan

fYear

2015

fDate

11-15 May 2015

Firstpage

1

Lastpage

1

Abstract

This study reports the control of microstructure of a NdFeB film to increase its thickness. The NdFeB film is deposited on Si substrates via pulsed laser ablation and crystallized by pulse annealing. SEM-EDX and vibrating sample magnetometry are used for structural, compositional, and magnetic characterization. Observation of the microstructure reveals precipitation of Nd at the grain boundary.

Keywords

X-ray chemical analysis; annealing; boron alloys; crystallisation; grain boundaries; grain boundary segregation; iron alloys; magnetic thin films; magnetometry; metallic thin films; neodymium alloys; precipitation; pulsed laser deposition; scanning electron microscopy; NdFeB; SEM-EDX; Si; compositional characterization; film magnets; grain boundary; magnetic characterization; microstructure; precipitation; pulse annealing; pulsed laser ablation; structural characterization; vibrating sample magnetometry; Iron; Magnetic films; Magnetic properties; Pulsed laser deposition; Silicon; Substrates;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference (INTERMAG), 2015 IEEE

Conference_Location

Beijing

Print_ISBN

978-1-4799-7321-7

Type

conf

DOI

10.1109/INTMAG.2015.7156598

Filename

7156598