Title :
Magnetic characterization of on-chip integrated layer of substituted Sr-M hexaferrite beyond 10 GHz
Author :
Sai, R. ; Endo, Y. ; Shimada, Y. ; Naik, R. ; Bhat, N. ; Shivashankar, S.A. ; Yamaguchi, M.
Author_Institution :
Dept. of Electr. Eng., Tohoku Univ., Sendai, Japan
Abstract :
This paper reports the measurement of ferromagnetic resonance frequency of a thin layered structure of hexagonal ferrite, SrCoTiFe10O19. XRD, SEM, TEM, and EDAX are used for composition and microstructure characterization. Room-temperature VSM measurements are also performed to determine the magnetic hysteresis. A prominent microwave absorption peak is observed at 12.6 GHz without the presence of any external field and thus can be considered as the ferromagnetic resonance frequency.
Keywords :
X-ray chemical analysis; X-ray diffraction; cobalt compounds; crystal microstructure; ferrites; ferromagnetic materials; ferromagnetic resonance; magnetic hysteresis; magnetometry; microwave spectra; scanning electron microscopy; strontium compounds; titanium compounds; transmission electron microscopy; EDAX; SEM; SrCoTiFe10O19; TEM; VSM; XRD; composition characterization; ferromagnetic resonance frequency; frequency 12.6 GHz; hexagonal ferrite; magnetic hysteresis; microstructure; microwave absorption; on-chip integrated layer; temperature 293 K to 298 K; Coplanar waveguides; Frequency measurement; Magnetic anisotropy; Magnetic hysteresis; Magnetic resonance; Magnetosphere; Transmission line measurements;
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
DOI :
10.1109/INTMAG.2015.7156658
