DocumentCode
721547
Title
Fabrication of templates for achieving one-to-one grain matching in HAMR media
Author
Sundar, V. ; Zhou, B. ; Liu, Y. ; Zhu, J. ; Laughlin, D.
Author_Institution
Mater. Sci. & Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2015
fDate
11-15 May 2015
Firstpage
1
Lastpage
1
Abstract
In previous work, we reported on the fabrication of a regular template for the controlled two-phase growth of conventional CoPt-SiO2 PMR media. The template consisted of dome-morphology patterned into a Platinum FCC (111) textured thin film. When CoPt-SiO2 was sputtered, the artificially patterned domes acted as sites on which the CoPt grains grew, with the segregant growing within the trenches between these domes[1]. In current PMR media, a similar approach is used to achieve grain-to-grain matching between the Ru underlayer and the CoPt grains, wherein the Ru dome morphology is fabricated using high Ar pressure during the sputtering process. In case of HAMR media however, achieving grain-to-grain matching between the underlayer is proving quite challenging. In this work, we explore using a pre-fabricated dome morphology in the underlayer to achieve grain-to-grain matching for the HAMR media (FePt). Block copolymers are first used to fabricate a pattern consisting of a hexagonal lattice of spheres of one block in the other block´s matrix . The pattern is then transferred into an amorphous carbon hard mask using Reactive Ion Etching (RIE) and subsequently into the underlayers using ion-milling, as described in our previous work[1] .
Keywords
amorphous state; carbon; iron alloys; magnetic recording; magnetic thin films; milling; platinum alloys; polymer blends; sputter etching; C; FePt; HAMR media; amorphous carbon hard mask; block copolymers; dome morphology; hexagonal lattice; ion-milling; one-to-one grain matching; reactive ion etching; spheres; templates; underlayer; Carbon; FCC; Films; Heat-assisted magnetic recording; Media; Morphology; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4799-7321-7
Type
conf
DOI
10.1109/INTMAG.2015.7156685
Filename
7156685
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