Title :
The effect of cationic disorder on low temperature magnetic properties of MnZn ferrite nanoparticles
Author :
Mallesh, S. ; Mutta, V. ; Srinivas, V.
Author_Institution :
Dept. OF Phys., Indian Inst. of Technol., Madras, Chennai, India
Abstract :
Bulk MnZn spinel-ferrite compacts are commonly used in the medium range frequency applications, while their nanoparticle (NP) counter parts are envisaged for biomedical applications like drug delivery, magnetic hyperthermia treatments and magnetic resonance imaging. It is now established that the magnetic properties of NPs depend on the method of synthesis, particle size, cat-ion distribution and composition. In bulk ferrites the competition between the two sub-lattice magnetization generates interesting M-T curves while in NPs undergo further changes as a function of temperature due to superparamagnetic (SPM) and surface spin effects. Although the SPM limit of the particles is reported to be ~20 nm, it is observed that the blocking temperature (TB) increases with Mn concentration. However, when NPs are heat treated at higher temperatures the TB increased for Zn-ferrite while it is decreased for Silica-coated Zn-ferrite NPs. In this work we investigate low temperature magnetic properties of MnxZn1-xFe2O4 (x=0.0 and 0.6) ferrites NPs in comparison with their bulk counterpart to obtain deeper understanding into the nature of transition temperature. Further we delve upon the origin of the magnetic transition observed in these systems.
Keywords :
ferrites; magnetic particles; magnetic transition temperature; magnetisation; manganese compounds; nanomagnetics; nanoparticles; superparamagnetism; zinc compounds; MnxZn1-xFe2O4; blocking temperature; cationic disorder; ferrite nanoparticles; low temperature magnetic properties; magnetic transition temperature; magnetization; superparamagnetic state; Magnetic hysteresis; Magnetic resonance imaging; Magnetization; Magnetometers; Temperature; Temperature dependence; Temperature measurement;
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
DOI :
10.1109/INTMAG.2015.7157340