Title :
III–V/Ge MOSFETs and tunneling FETs on Si platform for low power logic applications
Author :
Takagi, Shinichi ; Takenaka, Mitsuru
Author_Institution :
Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
Abstract :
CMOS utilizing high mobility III-V/Ge channels on Si substrates is expected to be one of the promising devices for low power advanced LSIs in the future, because of the expectation of high current drive. In addition, Tunneling-FET (TFET) using III-V/Ge-based materials can also be one of the important device families with steep slope device switching, which is mandatory for the ultra-low power devices. In this paper, we address the device engineering of III-V/Ge channel formation, low resistivity source/drain (S/D) with steep profile and MOS gate stacks for realizing these devices, compatible with the Si platform.
Keywords :
CMOS integrated circuits; III-V semiconductors; MOSFET; elemental semiconductors; field effect transistor circuits; gallium arsenide; germanium; indium compounds; low-power electronics; silicon; CMOS utilizing high mobility; III-V/Ge MOSFET; III-V/Ge channel formation; InGaAs-Ge; MOS gate stacks; Si; Si platform; Si substrates; current drive; low power logic applications; low resistivity source/drain; steep slope device switching; tunneling FET; CMOS integrated circuits; Indium gallium arsenide; Logic gates; MOSFET; Silicon; Substrates; Tunneling; Germanium; III–V semiconductors; Interface states; MOSFET; Metal-Oxide-Semiconductor; Mobility; Tunneling FET;
Conference_Titel :
Future of Electron Devices, Kansai (IMFEDK), 2015 IEEE International Meeting for
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-8614-9
DOI :
10.1109/IMFEDK.2015.7158488