Title :
Optimal sample size allocation for integrated test scheme
Author :
Guangling Dong ; Chi He ; Zhengguo Dai
Author_Institution :
Dept. of Test Technol., Baicheng Ordnance Test Center of China, Baicheng, China
Abstract :
Integrated test scheme (ITS) make comprehensive use of simulation and field test to evaluate system performance, which takes on merits of low cost, full-scale assessment, and high precision. Sample size determination (SSD) methods for ITS are analyzed, which reveals the problem and contradiction in classical method and Bayesian method using standard power prior for design. Design effect of experiment is proposed considering the influence of prior sample size, which is used for elicitation of modified power prior for SSD of ITS. Taking average posterior variance for parameter of interest as the output precision, optimization equation for SSD of ITS under required posterior precision constraint is designed, whose effectiveness is illustrated with a utilization example.
Keywords :
design of experiments; optimisation; performance evaluation; Bayesian method; ITS; SSD methods; design effect of experiment; integrated test scheme; optimal sample size allocation; optimization equation; output precision; posterior precision constraint; sample size determination methods; system performance evaluation; Bayes methods; Computational modeling; Data models; Mathematical model; Reactive power; Resource management; Standards; Bayesian sample size determination; design effect; integrated test scheme; power prior; sample size allocation;
Conference_Titel :
Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA), 2015 IEEE International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CIVEMSA.2015.7158624
