• DocumentCode
    723066
  • Title

    Thermal compression bonding for fine pitch solder interconnects

  • Author

    Jie Fu ; Aldrete, Manuel ; Shah, Milind ; Noveski, Vladimir ; Hsu, Marcus

  • Author_Institution
    Qualcomm Technol., Inc., San Diego, CA, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    7
  • Lastpage
    11
  • Abstract
    Thermal Compression Flip Chip bonding (TCFC) is a new interconnection technology in electronic packaging. With decreasing pitch of solder interconnects, traditional mass reflow solder bump faces the risk of shorting and non-wets for very fine pitch devices. The drive for ever-increasing numbers of interconnects, coupled with limited package size, necessitates finer pitch flip-chip solutions. In this paper, we introduce a TCFC-bonded copper pillar with solder cap interconnect solution, using non-conductive paste (NCP) on a laminate substrate with busless surface finish. This TCFC interconnect provides improved ELK performance relative to traditional mass reflow. The challenges to achieve a reliable TCFC solder joint structure will be discussed from different aspects such as assembly process, substrate surface finish and reliability testing.
  • Keywords
    copper; fine-pitch technology; flip-chip devices; integrated circuit interconnections; laminates; reflow soldering; solders; surface finishing; thermal management (packaging); Cu; ELK performance; NCP; TCFC-bonded copper pillar; busless surface finish; electronic packaging; fine pitch devices; fine pitch solder interconnects; laminate substrate; mass reflow solder bump; nonconductive paste; reliable TCFC solder joint structure; solder cap interconnect solution; thermal compression flip chip bonding; Bonding forces; Flip-chip devices; Reliability; Soldering; Substrates; Surface finishing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159563
  • Filename
    7159563