• DocumentCode
    723096
  • Title

    Thermal management of 3D stacked dies with air convection and water cooling methods

  • Author

    Delong Qiu ; Liqiang Cao ; Xiaomeng Wu ; Fen Gze Hou ; Jing Zhang ; Qidong Wang

  • Author_Institution
    Microsyst. Packaging Res. Center, Inst. of Microelectron., Beijing, China
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    839
  • Lastpage
    844
  • Abstract
    3D stacked dies structure is a promising architecture to realize small feature size and enhanced electronic performance. However, its thermal dissipating performance for high density integration has aroused extensive attention. In this paper, a 3D stacked structure for thermal behavior investigation is presented. The vertical temperature profile of the stacked structure is obtained. A thermal resistance network and a finite element model have been built to fit the experiment data. Thermal management for the 3D stacked structure also is studied by air force cooling and immersion de-ionized (DI) water cooling. A good agreement between models and experiments is observed, while the temperature difference between models and experiments is within 5%. Under the air force convection and immersion cooling, the highest temperature point to ambient thermal resistance of the 3D stacked structure decreases to 7.6°C/W and 1°C/W respectively.
  • Keywords
    finite element analysis; forced convection; integrated circuit packaging; thermal management (packaging); 3D stacked dies; air convection method; air force cooling; deionized water cooling immersion; finite element model; force convection; high density integration; immersion cooling; thermal dissipation; thermal management; thermal resistance network; vertical temperature profile; water cooling method; Heat sinks; Thermal resistance; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159690
  • Filename
    7159690