Title :
Micro-fabricated spherical rubidium vapor cell and its integration in 3-axis atomic magnetometer
Author :
Yu Ji ; Jintang Shang ; Qi Gan ; Lei Wu ; Ching-Ping Wong
Author_Institution :
Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing, China
Abstract :
High sensitive atomic magnetometers play an important role in many fields including geophysical mapping, space science, nuclear magnetic resonance, health care and perimeter and remote monitoring. In this study, a novel method to fabricate the micro spherical Rubidium vapor cell has been investigated and the integration of micro spherical rubidium vapor cell in 3-axis atomic magnetometer has been demonstrated successfully. First of all, a fabrication process for micro spherical alkali vapor cells is introduced. Then the prepared uniform wafer-level micro spherical rubidium vapor cell has been characterized by Ultraviolet spectrophotometer as well as a laser frequency locking system. At last, 3-axis atomic magnetometer based on the micro spherical rubidium vapor cell has been demonstrated. Results show that micro spherical rubidium vapor cell has been fabricated successfully. Results also indicate that a 3-axis atomic magnetometer based on the micro spherical rubidium vapor cell could measure magnetic fields along three directions (BX, BY and BZ).
Keywords :
magnetic field measurement; magnetic sensors; magnetometers; microfabrication; microsensors; rubidium; spectrophotometers; ultraviolet detectors; 3-axis atomic magnetometer; Rb; geophysical mapping; health care; laser frequency locking system; magnetic field measurement; microfabricated spherical rubidium vapor cell; microspherical alkali vapor cell; nuclear magnetic resonance; perimeter monitoring; remote monitoring; space science; ultraviolet spectrophotometer; uniform wafer-level micro spherical rubidium vapor cell; Atomic beams; Atomic clocks; Atomic measurements; Magnetic field measurement; Magnetic fields; Magnetic resonance; Magnetometers;
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
DOI :
10.1109/ECTC.2015.7159708