• DocumentCode
    723116
  • Title

    Crystal plasticity finite element analysis of electromigration-induced deformation behavior in lead-free solder joints

  • Author

    Ni, Jiamin ; Maniatty, Antoinette ; Yong Liu ; Hao, Jifa

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    1023
  • Lastpage
    1028
  • Abstract
    The elastic and plastic anisotropy of β-Sn has an important effect on the stress state, and hence the electromigration induced degradation in Sn-based solder joints. A crystal plasticity model is developed to capture this effect. Calibration of this model is done by using the available literature data. Future refinement of the slip parameters is needed to optimize the model. The model is implemented in a finite element framework and is used to simulate the response of single crystal β-Sn to electromigration induced strains. This work can be used as a basis for future development of coupled models of electromigration and stress induced degradation in Sn-based solders.
  • Keywords
    elastic deformation; elastoplasticity; electromigration; finite element analysis; plastic deformation; solders; tin; Sn; crystal plasticity model; elastic anisotropy; electromigration induced strains; electromigration-induced deformation behavior; finite element analysis; lead-free solder joints; plastic anisotropy; single crystal β-Sn; stress induced degradation; stress state; Crystals; Electromigration; Geometry; Plastics; Strain; Stress; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159721
  • Filename
    7159721