DocumentCode
723116
Title
Crystal plasticity finite element analysis of electromigration-induced deformation behavior in lead-free solder joints
Author
Ni, Jiamin ; Maniatty, Antoinette ; Yong Liu ; Hao, Jifa
Author_Institution
Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2015
fDate
26-29 May 2015
Firstpage
1023
Lastpage
1028
Abstract
The elastic and plastic anisotropy of β-Sn has an important effect on the stress state, and hence the electromigration induced degradation in Sn-based solder joints. A crystal plasticity model is developed to capture this effect. Calibration of this model is done by using the available literature data. Future refinement of the slip parameters is needed to optimize the model. The model is implemented in a finite element framework and is used to simulate the response of single crystal β-Sn to electromigration induced strains. This work can be used as a basis for future development of coupled models of electromigration and stress induced degradation in Sn-based solders.
Keywords
elastic deformation; elastoplasticity; electromigration; finite element analysis; plastic deformation; solders; tin; Sn; crystal plasticity model; elastic anisotropy; electromigration induced strains; electromigration-induced deformation behavior; finite element analysis; lead-free solder joints; plastic anisotropy; single crystal β-Sn; stress induced degradation; stress state; Crystals; Electromigration; Geometry; Plastics; Strain; Stress; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/ECTC.2015.7159721
Filename
7159721
Link To Document