DocumentCode :
723116
Title :
Crystal plasticity finite element analysis of electromigration-induced deformation behavior in lead-free solder joints
Author :
Ni, Jiamin ; Maniatty, Antoinette ; Yong Liu ; Hao, Jifa
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
1023
Lastpage :
1028
Abstract :
The elastic and plastic anisotropy of β-Sn has an important effect on the stress state, and hence the electromigration induced degradation in Sn-based solder joints. A crystal plasticity model is developed to capture this effect. Calibration of this model is done by using the available literature data. Future refinement of the slip parameters is needed to optimize the model. The model is implemented in a finite element framework and is used to simulate the response of single crystal β-Sn to electromigration induced strains. This work can be used as a basis for future development of coupled models of electromigration and stress induced degradation in Sn-based solders.
Keywords :
elastic deformation; elastoplasticity; electromigration; finite element analysis; plastic deformation; solders; tin; Sn; crystal plasticity model; elastic anisotropy; electromigration induced strains; electromigration-induced deformation behavior; finite element analysis; lead-free solder joints; plastic anisotropy; single crystal β-Sn; stress induced degradation; stress state; Crystals; Electromigration; Geometry; Plastics; Strain; Stress; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/ECTC.2015.7159721
Filename :
7159721
Link To Document :
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