Title :
Modeling, design and demonstration of ultra-miniaturized glass PA modules with efficient thermal dissipation
Author :
Min Suk Kim ; Sangbeom Cho ; Junki Min ; Pulugurtha, Markondeya Raj ; Huang, Nathan ; Sitaraman, Srikrishna ; Sundaram, Venky ; Velez, Mario ; Ravindran, Arjun ; Joshi, Yogendra ; Tummala, Rao
Author_Institution :
3D Syst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper addresses the thermal dissipation of power amplifier (PA) chips, which is one of the biggest challenges in the development of ultra-miniaturized glass-based RF modules. Glass packages with 3D or double-side active and passive integration offer the best miniaturization and performance enhancement for RF modules because glass has ultra-low loss, dimensional stability for precision thinfilm components, ability to process through-vias in large panels to reduce cost. However, glass is a poor thermal conductor. Cooling of the high-power PA die with integrated miniaturized RF modules is, therefore, a key challenge. This paper provides extensive modeling studies of RF power amplifier modules with copper thermal vias in ultra-miniaturized glass, without additional process steps. It considers various power amplifier design options such as: Si vs. Silicon-on-Insulator (SOI); location of die hotspot; via geometry; and conformal vs. fully-filled vias, and provides optimal design recommendations with modeling and analysis.
Keywords :
glass; integrated circuit design; integrated circuit modelling; integrated circuit packaging; modules; power amplifiers; radiofrequency amplifiers; radiofrequency integrated circuits; thermal management (packaging); vias; RF power amplifier modules; conformal via; copper thermal vias; die hotspot location; double side active integration; fully-filled via; glass package; integrated miniaturized RF module; passive integration; power amplifier chips; thermal dissipation; ultraminiaturized glass based RF module; ultraminiaturized glass power amplifier modules; via geometry; Cooling; Copper; Glass; Heating; Radio frequency; Silicon; Steady-state;
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
DOI :
10.1109/ECTC.2015.7159742