• DocumentCode
    723139
  • Title

    NiSn4 in solder joints between Sn-3.5Ag and Ni, ENIG or ENEPIG

  • Author

    Belyakov, S.A. ; Gourlay, C.M.

  • Author_Institution
    Dept. of Mater., Imperial Coll. London, London, UK
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    1273
  • Lastpage
    1279
  • Abstract
    Sn-3.5Ag solder is commonly used with ENIG (electroless nickel, immersion gold) and ENEPIG (electroless nickel, electroless palladium, immersion gold) platings. Most research has focused on the interfacial reactions with the substrate and the microstructure development. In the present study we describe a new phenomenon that has been missed in past research: the formation of metastable eutectic βSn+Ag3Sn+NiSn4 instead of the equilibrium βSn+Ag3Sn+Ni3Sn4 eutectic during solder bulk solidification in Sn-3.5Ag/Ni, Sn-3.5Ag/ENIG and Sn-3.5Ag/ENEPIG joints. It is shown that metastable NiSn4 transforms during ageing at 150°C and that the transformation occurs in two stages (i) coarsening of NiSn4 eutectic sheets into tile-like crystals and (ii) decomposition of the coarsened NiSn4 crystals into Ni3Sn4 and βSn. It is further shown that Pd additions of ~2at% can stabilize NiSn4, preventing decomposition into Ni3Sn4. However, Pd from the ENEPIG substrate also causes a relatively large volume fraction of NiSn4 to form which coarsens rapidly at 150°C.
  • Keywords
    electroless deposition; eutectic alloys; gold alloys; nickel alloys; palladium alloys; solders; NiSn4; Pd; SnAg; electroless nickel platings; electroless palladium platings; eutectic sheets; immersion gold platings; solder joints; temperature 150 degC; Aging; Gold; Joints; Microstructure; Nickel; Soldering; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159761
  • Filename
    7159761