• DocumentCode
    723172
  • Title

    Investigation of WLCSP corrosion induced reliability failure on halogens environment for wearable electronics

  • Author

    Chen, J.H. ; Kuo, Y.L. ; Tsao, P.H. ; Tseng, Jerry ; Chen, Megan ; Chen, T.M. ; Lin, Y.T. ; Antai Xu

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    1599
  • Lastpage
    1603
  • Abstract
    Continuous miniaturization of microelectronic devices is enabling more portable and wearable electronic products such as thinner smart phones and smart watches. WLCSP (Wafer Level Chip Size Package) has been widely adopted for portable and wearable electronic products due to its compactness. Microelectronic devices in wearable products may be exposed to chlorine and fluorine because they come in direct contact with the human body under wearing condition. Products of chlorine corrosion have been found in WLCSP product evaluations, thus it is necessary to investigate WLCSP corrosion resistance and the factors affecting its corrosion reliability.
  • Keywords
    corrosion; halogens; integrated circuit reliability; wafer level packaging; WLCSP corrosion induced reliability failure; chlorine corrosion; corrosion reliability; corrosion resistance; halogens environment; wafer level chip size package; wearable electronics; Chemical lasers; Chemicals; Corrosion; Humidity; Metals; Power lasers; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159810
  • Filename
    7159810