DocumentCode
723172
Title
Investigation of WLCSP corrosion induced reliability failure on halogens environment for wearable electronics
Author
Chen, J.H. ; Kuo, Y.L. ; Tsao, P.H. ; Tseng, Jerry ; Chen, Megan ; Chen, T.M. ; Lin, Y.T. ; Antai Xu
Author_Institution
Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
fYear
2015
fDate
26-29 May 2015
Firstpage
1599
Lastpage
1603
Abstract
Continuous miniaturization of microelectronic devices is enabling more portable and wearable electronic products such as thinner smart phones and smart watches. WLCSP (Wafer Level Chip Size Package) has been widely adopted for portable and wearable electronic products due to its compactness. Microelectronic devices in wearable products may be exposed to chlorine and fluorine because they come in direct contact with the human body under wearing condition. Products of chlorine corrosion have been found in WLCSP product evaluations, thus it is necessary to investigate WLCSP corrosion resistance and the factors affecting its corrosion reliability.
Keywords
corrosion; halogens; integrated circuit reliability; wafer level packaging; WLCSP corrosion induced reliability failure; chlorine corrosion; corrosion reliability; corrosion resistance; halogens environment; wafer level chip size package; wearable electronics; Chemical lasers; Chemicals; Corrosion; Humidity; Metals; Power lasers; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/ECTC.2015.7159810
Filename
7159810
Link To Document