Title :
Demonstration of ultra-thin tantalum capacitors on silicon substrates for high-frequency and high-efficiency power applications
Author :
Chakraborti, Parthasarathi ; Gandhi, Saumya ; Sharma, Himani ; Raj, P.M. ; Rataj, Kamil-Paul ; Tummala, Rao
Author_Institution :
3D Syst. Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper describes an innovative scheme for integrating thinfilm tantalum (Ta) capacitors on active silicon substrates, an approach that can serve as a roadmap for the potential integration of ultra-thin high density capacitors in near future. The paper describes a new 3D concept for ultra-miniaturized, multi-functional and relatively low-cost power converter modules. The scheme consists of planar tantalum (Ta) capacitors by forming Ta2O5 (30-120 nm thick) dielectric and attaching directly to active or passive Si substrates using ultra-loss dielectrics (Zeon, ZS-100). Capacitors attached directly on Si allow for shorter interconnection length (<; 10μm) yielding lower parasitics in loop inductance and planar resistance. Reducing these parasitics results in higher switching frequency (>100 MHz) with fewer Ta capacitors on active Si. The paper focuses on capacitor fabrication of ultra-thin Ta foils (<; 5μm) and their integration on ultra-thin active Si for lowering the parasitics. Consequently, electrical characterization of the above capacitors demonstrates the fundamental electrical superiority of the 3D integrated Ta capacitors.
Keywords :
elemental semiconductors; power capacitors; power convertors; power semiconductor devices; semiconductor device manufacture; semiconductor thin films; silicon; tantalum; thin film capacitors; Si; Ta; Ta2O5; ZS-100; Zeon; capacitor fabrication; passive substrates; power converter modules; size 30 nm to 120 nm; thin film capacitors; ultra-loss dielectrics; ultra-thin foils; ultra-thin tantalum capacitors; Capacitance; Capacitors; Copper; Leakage currents; Polymers; Silicon;
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
DOI :
10.1109/ECTC.2015.7159917