• DocumentCode
    72392
  • Title

    Variation-Aware Layer Assignment With Hierarchical Stochastic Optimization on a Multicore Platform

  • Author

    Xiaodao Chen ; Dan Chen ; Lizhe Wang ; Ze Deng ; Ranjan, Rajiv ; Zomaya, Albert Y. ; Shiyan Hu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan Technol. Univ., Houghton, MI, USA
  • Volume
    2
  • Issue
    4
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    488
  • Lastpage
    500
  • Abstract
    As the very large scale integration (VLSI) technology enters the nanoscale regime, VLSI design is increasingly sensitive to variations on process, voltage, and temperature. Layer assignment technology plays a crucial role in industrial VLSI design flow. However, existing layer assignment approaches have largely ignored these variations, which can lead to significant timing violations. To address this issue, a variation-aware layer assignment approach for cost minimization is proposed in this paper. The proposed layer assignment approach is a single-stage stochastic program that directly controls the timing yield via a single parameter, and it is solved using Monte Carlo simulations and the Latin hypercube sampling technique. A hierarchical design is also adopted to enable the optimization process on a multicore platform. Experiments have been performed on 5000 industrial nets, and the results demonstrate that the proposed approach: 1) can significantly improve the timing yield by 64% in comparison with the nominal design and 2) can reduce the wire cost by 15.7% in comparison with the worst case design.
  • Keywords
    Monte Carlo methods; VLSI; logic design; multiprocessing systems; sampling methods; stochastic programming; Latin hypercube sampling technique; Monte Carlo simulation; VLSI design; VLSI technology; cost minimization; hierarchical design; hierarchical stochastic optimization; layer assignment technology; multicore platform; nominal design; single-stage stochastic program; timing violation; variation-aware layer assignment; very large scale integration technology; worst case design; Capacitance; Large-scale systems; Nanoscale devices; Programming; Stochastic processes; Very large scale integration; Layer assignment; stochastic programming; variation-aware design;
  • fLanguage
    English
  • Journal_Title
    Emerging Topics in Computing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2168-6750
  • Type

    jour

  • DOI
    10.1109/TETC.2014.2316503
  • Filename
    6786337