Title :
Ionosphere occultation inversion method and anti-disturbance performance analysis
Author :
Wang Junyi ; Wang Yan ; Guo Lei
Author_Institution :
Sch. of Instrum. Sci. & Opto-Electron. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
Ionosphere occultation inversion technique is an important means of the ionosphere exploration. Researches on its accuracy and anti-disturbance performance contribute to improve the retrieval results, which is also useful to assess the applied conditions of different methods. In this paper, we firstly analyses three kinds of inversion methods for the electron density in detail, including the Abel integral method, the “Onion-layered” method and the least squares method. Then, we put forward a smoothing way by averaging three fitting functions with weights for the upper ionosphere. Eventually we discuss the retrieved accuracy and anti-disturbance performance of the inversion methods. And numerical simulations based on the calibrated TEC data of COSMIC are carried out. In conclusion, the retrieved accuracy of upper electron density significantly improves after the smooth, which verifies its effectiveness. In addition, the retrieved accuracy by “Onion-layered” method is better than by the least squares method. But when the input disturbances present, the latter behaves better.
Keywords :
atmospheric electricity; electron density; ionospheric disturbances; least squares approximations; Abel integral method; COSMIC TEC data; antidisturbance performance analysis; fitting functions; ionosphere exploration; ionosphere occultation inversion method; least squares method; numerical simulation; onion-layered method; upper electron density; upper ionosphere; Accuracy; Earth; Fitting; Ionosphere; Least squares approximations; Smoothing methods; Accuracy Analysis; Anti-disturbance Performance; Electron Density Inversion; Ionosphere;
Conference_Titel :
Control and Decision Conference (CCDC), 2015 27th Chinese
Conference_Location :
Qingdao
Print_ISBN :
978-1-4799-7016-2
DOI :
10.1109/CCDC.2015.7162349