DocumentCode :
724576
Title :
Physical models for 2.4 mm and 3.5 mm coaxial VNA calibration kits developed within the NIST microwave uncertainty framework
Author :
Jargon, Jeffrey A. ; Chihyun Cho ; Williams, Dylan F. ; Hale, Paul D.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2015
fDate :
22-22 May 2015
Firstpage :
1
Lastpage :
7
Abstract :
We developed physical models of commercially-available 2.4 mm and 3.5 mm coaxial calibration kits for vector network analyzers. These models support multiline thru-reflect-line (TRL) and open-short-load-thru (OSLT) calibrations, and include error mechanisms in each of the standards´ constituent parameters that can be utilized in the NIST Microwave Uncertainty Framework to propagate uncertainties. For both connector sizes, we calibrated a network analyzer using the two calibration methods, and compared measurements and uncertainties made on a number of verification devices. In both cases, we showed that the two calibrations agree to within their respective uncertainties.
Keywords :
calibration; measurement standards; measurement uncertainty; network analysers; NIST microwave uncertainty framework; OSLT calibration; TRL calibration; coaxial VNA calibration kit; multiline thru-reflect-line calibration; open-short-load-thru calibration; physical model; vector network analyzer; Calibration; Frequency measurement; Load modeling; Polynomials; Reflection coefficient; Standards; Uncertainty; calibration; coaxial; physical models; uncertainty; vector network analyzer; verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2015 85th
Conference_Location :
Phoenix, AZ
Type :
conf
DOI :
10.1109/ARFTG.2015.7162913
Filename :
7162913
Link To Document :
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