Title :
Solving the Third-Shift Problem in IC Piracy With Test-Aware Logic Locking
Author :
Plaza, Stephen M. ; Markov, Igor L.
Author_Institution :
Janelia Res. Campus, Ashburn, VA, USA
Abstract :
The increasing IC manufacturing cost encourages a business model where design houses outsource IC fabrication to remote foundries. Despite cost savings, this model exposes design houses to IC piracy as remote foundries can manufacture in excess to sell on the black market. Recent efforts in digital hardware security aim to thwart piracy by using XOR-based chip locking, cryptography, and active metering. To counter direct attacks and lower the exposure of unlocked circuits to the foundry, we introduce a multiplexor-based locking strategy that preserves test response allowing IC testing by an untrusted party before activation. We demonstrate a simple yet effective attack against a locked circuit that does not preserve test response, and validate the effectiveness of our locking strategy on IWLS 2005 benchmarks.
Keywords :
integrated circuit manufacture; integrated circuit modelling; logic design; logic testing; IC manufacturing cost; IC piracy; IWLS 2005 benchmarks; XOR-based chip locking; active metering; business model; cost savings; counter direct attacks; cryptography; design houses outsource IC fabrication; digital hardware security; remote foundries; test-aware logic locking; third-shift problem; thwart piracy; Cryptography; Fabrication; Integrated circuit modeling; Logic gates; Tin; Vectors; Chip locking; EPIC; IP protection; chip locking; design for testability; ending piracy of integrated circuits (EPIC); secure hardware; third-shift problem;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2015.2404876