• DocumentCode
    72476
  • Title

    2016 IEEE international reliability physics symposium

  • Volume
    36
  • Issue
    6
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    630
  • Lastpage
    630
  • Abstract
    Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2434573
  • Filename
    7110673