DocumentCode
725092
Title
MEMS manufacturing solutions
Author
Fukui, Jumpei ; Osanai, Makoto ; Mizoroke, Shigeo ; Khorram, Hamid R.
Author_Institution
Nikon Eng. Co., Ltd., Yokohama, Japan
fYear
2015
fDate
3-6 May 2015
Firstpage
356
Lastpage
361
Abstract
Reducing time to market and cost-of-ownership is essential to MEMS makers. Therefore, lithography tools that continue to provide new, flexible, and versatile substrate alignment solutions, including backside alignment capabilities, are crucial factors in optimizing MEMS processes for faster production ramps. In order to determine the alignment technique that delivers optimal accuracy and throughput, it is necessary for MEMS manufacturers to be able to quickly evaluate a variety of front and backside alignment scenarios, and determine the best conditions for their specific MEMS processes. Various alignment methods available using Nikon MEMS steppers can achieve high overlay accuracy for non-EGA (Enhanced Global Alignment) applicable wafers, as well as for other substrates used in MEMS, LED, and ABS (air bearing surface) production. High overlay accuracy can also be achieved for applications that include exposure of both sides of the wafer such as MEMS and Power Devices. Newly developed Nikon MEMS Stepper alignment methods significantly enhance overlay optimization and performance capabilities, and contribute to reduction in MEMS time to market.
Keywords
lithography; microfabrication; micromechanical devices; time to market; ABS production; LED; MEMS makers; MEMS manufacturers; MEMS processes; MEMS time to market; Nikon MEMS steppers; air bearing surface; alignment technique; backside alignment capabilities; backside alignment scenarios; cost-of-ownership; enhanced global alignment; lithography tools; non-EGA applicable wafers; overlay accuracy; overlay optimization; power devices; production ramps; substrate alignment solutions; Accuracy; Manufacturing; Micromechanical devices; Microscopy; Production; Substrates; Throughput; ABS; Backside Alignment; MEMS; Power Device; SiC; TAIKO;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference (ASMC), 2015 26th Annual SEMI
Conference_Location
Saratoga Springs, NY
Type
conf
DOI
10.1109/ASMC.2015.7164419
Filename
7164419
Link To Document