Title :
Shortening of cycle time in semiconductor manufacturing via meaningful lot sizes
Author :
Eberts, Dietrich ; Keil, Sophia ; Peipp, Frederik ; Lasch, Rainer
Author_Institution :
Dept. of Line Control, Infineon Technol. Dresden GmbH, Dresden, Germany
Abstract :
Cycle time requirements from prime or major customers contradict the ever-increasing complexity of wafer fabrication. Lot size variations show up as significant cycle time improvement potential for single wafer processes. Further reduction potential aside of process times is shown regarding tool-internal waiting times. A model is elaborated to assure cost efficiency while significantly reducing lot raw tool time. The models innovation is to combine real lot move data with inside tool logistics to extend current research activities, including a simulation for its evaluation. Results of raw tool time reduction point to strategies for the surrounding WIP flow control.
Keywords :
semiconductor device manufacture; semiconductor industry; semiconductor technology; WIP flow control; cost efficiency; cycle time improvement potential; cycle time requirements; inside tool logistics; lot raw tool time; lot size variations; models innovation; process times; raw tool time reduction point; real lot move data; reduction potential; single wafer processes; tool-internal waiting times; wafer fabrication; Complexity theory; Data mining; Logistics; Mathematical model; Semiconductor device modeling; Throughput; cost efficiency; cycle time reduction; meaningful lot size; prime customers; raw tool time; throughput; time to market; tool characteristics;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2015 26th Annual SEMI
Conference_Location :
Saratoga Springs, NY
DOI :
10.1109/ASMC.2015.7164447