DocumentCode
725115
Title
Shortening of cycle time in semiconductor manufacturing via meaningful lot sizes
Author
Eberts, Dietrich ; Keil, Sophia ; Peipp, Frederik ; Lasch, Rainer
Author_Institution
Dept. of Line Control, Infineon Technol. Dresden GmbH, Dresden, Germany
fYear
2015
fDate
3-6 May 2015
Firstpage
34
Lastpage
41
Abstract
Cycle time requirements from prime or major customers contradict the ever-increasing complexity of wafer fabrication. Lot size variations show up as significant cycle time improvement potential for single wafer processes. Further reduction potential aside of process times is shown regarding tool-internal waiting times. A model is elaborated to assure cost efficiency while significantly reducing lot raw tool time. The models innovation is to combine real lot move data with inside tool logistics to extend current research activities, including a simulation for its evaluation. Results of raw tool time reduction point to strategies for the surrounding WIP flow control.
Keywords
semiconductor device manufacture; semiconductor industry; semiconductor technology; WIP flow control; cost efficiency; cycle time improvement potential; cycle time requirements; inside tool logistics; lot raw tool time; lot size variations; models innovation; process times; raw tool time reduction point; real lot move data; reduction potential; single wafer processes; tool-internal waiting times; wafer fabrication; Complexity theory; Data mining; Logistics; Mathematical model; Semiconductor device modeling; Throughput; cost efficiency; cycle time reduction; meaningful lot size; prime customers; raw tool time; throughput; time to market; tool characteristics;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference (ASMC), 2015 26th Annual SEMI
Conference_Location
Saratoga Springs, NY
Type
conf
DOI
10.1109/ASMC.2015.7164447
Filename
7164447
Link To Document