DocumentCode :
725605
Title :
Infrared windows applied in switchgear assemblies: Taking another look
Author :
Durocher, David B. ; Loucks, David
Author_Institution :
Eaton Corp., Wilsonville, OR, USA
fYear :
2015
fDate :
14-18 June 2015
Firstpage :
1
Lastpage :
6
Abstract :
Maintenance of electrical power distribution assemblies applied in industry has been critical in assuring facility uptime and reliability. One important metric in assuring reliability is electrical terminations of energized conductors. During normal energized service, terminations both at conductor bus joints and at cable terminations are subject over time to thermal expansion and contraction, ultimately resulting in loosened connections and excessive heat. Deteriorating terminations left unchecked will ultimately fail, resulting in electrical hazards for personnel and also costly loss of production. Infrared (IR) inspection has proved to be an excellent maintenance method used to identifying problems with loose electrical terminations. However, the design of Internal Arc Classified (IAC) switchgear assemblies to address arc-flash concerns has changed assembly designs that now limiting line of sight access necessary for IR inspection via windows. This paper will discuss global Standards, how they affect switchgear designs and application of IR windows, then present some alternative technologies that in some applications may be more suitable.
Keywords :
assembling; infrared imaging; inspection; maintenance engineering; power cables; power distribution reliability; switchgear; IR windows; arc-flash; cable terminations; conductor bus joints; electrical hazards; electrical power distribution assemblies; energized conductors; facility reliability; facility uptime; infrared inspection; infrared windows; internal arc classified switchgear assemblies; loose electrical terminations; maintenance method; normal energized service; production loss; thermal contraction; thermal expansion; Assembly; Conductors; Standards; Switchgear; Temperature sensors; Arc-Resistant Switchgear; IR Windows; Infrared Camera; Thermal Imaging; Thermal Sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulp and Paper Industry Conference (PPIC), 2015 61st IEEE
Conference_Location :
Milwaukee, WI
ISSN :
0190-2172
Print_ISBN :
978-1-4799-7113-8
Type :
conf
DOI :
10.1109/PPIC.2015.7165710
Filename :
7165710
Link To Document :
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