Title :
Investigation of Flip-Flop Effects in a Linear Analog Comparator-With-Hysteresis Circuit
Author :
Roche, Nicholas J.-H ; Buchner, Stephen P. ; Roig, Fabien ; Dusseau, L. ; Warner, Jeffrey H. ; Boch, J. ; McMorrow, Dale ; Saigne, F. ; Auriel, G. ; Azais, Bruno
Author_Institution :
U.S. Naval Res. Lab., Washington, DC, USA
Abstract :
The impact of the positive feedback loop on analog single event transient (ASET) shapes was investigated for a comparator-with-hysteresis circuit. Simulation based on previous developed ASET simulation tool is used to model the impact of the power supply voltage, the input voltage level and the injected energy. Simulation results show that these kinds of circuits are sensitive to flip-flop effects. This phenomenon occurs if the input voltage is in the hysteresis band range. In this case, simulations show that the ASET can latch the output into a non-desired state by changing the state of the circuit on his transfer characteristic curves. Laser experiments were conducted and show that the simulation outputs are in agreement with the experimental collected data.
Keywords :
circuit feedback; circuit simulation; comparators (circuits); flip-flops; hysteresis; integrated circuit modelling; ASET simulation tool; analog single event transient shapes; flip-flop effects; hysteresis band range; hysteresis circuit; injected energy; input voltage level; linear analog comparator; positive feedback loop; power supply voltage; transfer characteristic curves; Hysteresis; Integrated circuit modeling; Power supplies; Shape; Threshold voltage; Transistors; Voltage measurement; Bipolar circuits; integrated circuit modeling; single event transient; transient propagation; transient response;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2258682
