• DocumentCode
    725963
  • Title

    Optimized Doherty power amplifier with a new offset line

  • Author

    Yunsik Park ; Juyeon Lee ; Seunghoon Jee ; Seokhyeon Kim ; Bumman Kim

  • Author_Institution
    Dept. of IT Convergence Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
  • fYear
    2015
  • fDate
    17-22 May 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This work proposes a new offset line of carrier PA for Doherty power amplifier (PA). The carrier PA of conventional Doherty PA (DPA) delivers lower efficiency at back-off output power than at peak output power due to the phase mismatch of the carrier offset line in implementation, because the efficiency at back-off power is very sensitive to the output impedance change. To solve the problem, a new offset line for the carrier PA is adopted optimizing the efficiency performance at back-off output power, while it maintains the output peak power. A Doherty PA with the concept is designed using 45 W gallium nitride (GaN) high electron mobility transistors (HEMT) for the carrier and peaking cells at 1.94 GHz. The measured average output power, drain/power-added efficiencies and gain are 43.6 dBm, 60.7/56.9%, and 12 dB for a 10MHz long term evolution (LTE) signal with a 6.5 dB peak-to-average power ratio (PAPR).
  • Keywords
    III-V semiconductors; Long Term Evolution; UHF power amplifiers; gallium compounds; high electron mobility transistors; wide band gap semiconductors; DPA; GaN; HEMT; LTE signal; Long Term Evolution; PAPR; back-off output power; carrier offset line; frequency 1.94 GHz; frequency 10 MHz; gallium nitride; high electron mobility transistor; impedance change; optimized Doherty power amplifier; output peak power; peak-to-average power ratio; phase mismatch; power 45 W; power added efficiency; Gain; Gold; HEMTs; Doherty power amplifier; drain efficiency (DE); long term evolution (LTE); offset line;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium (IMS), 2015 IEEE MTT-S International
  • Conference_Location
    Phoenix, AZ
  • Type

    conf

  • DOI
    10.1109/MWSYM.2015.7166743
  • Filename
    7166743