Title :
Robust stacked GaN-based low-noise amplifier MMIC for receiver applications
Author :
Andrei, Cristina ; Bengtsson, Olof ; Doerner, Ralf ; Chevtchenko, Serguei A. ; Rudolph, Matthias
Author_Institution :
Dept. of RF & Microwave Tech., Brandenburg Univ. of Technol., Cottbus, Germany
Abstract :
A robust two-stage low-noise amplifier based on GaN technology is presented. The MMIC LNA is realized using stacked transistors in the first stage to obtain high ruggedness. The LNA survived a record value of 43 dBm of input power at 5 GHz measured in a coaxial test fixture without any visible degradation of the transistors. The results prove that the new stacked architecture allows the LNA to withstand twice the CW input power expected for the conventional topology.
Keywords :
III-V semiconductors; MMIC amplifiers; gallium compounds; low noise amplifiers; receivers; transistors; wide band gap semiconductors; GaN; LNA; MMIC; coaxial test; frequency 5 GHz; low-noise amplifier; receiver; transistors; Aluminum gallium nitride; Gain; Gain measurement; Gallium nitride; Logic gates; Power measurement; Wide band gap semiconductors; low noise amplifier; monolithic microwave integrated circuit (MMIC) amplifiers; noise; ruggedness; stacked amplifier;
Conference_Titel :
Microwave Symposium (IMS), 2015 IEEE MTT-S International
Conference_Location :
Phoenix, AZ
DOI :
10.1109/MWSYM.2015.7166766