DocumentCode
726117
Title
Evolution of transverse correlation in stochastic electromagnetic fields
Author
Russer, Johannes A. ; Gradoni, Gabriele ; Tanner, Gregor ; Creagh, Stephen C. ; Thomas, David ; Smartt, Christopher ; Russer, Peter
Author_Institution
Inst. for Nanoelectron., Tech. Univ. Munchen, Munich, Germany
fYear
2015
fDate
17-22 May 2015
Firstpage
1
Lastpage
3
Abstract
In this work the evolution of the transverse correlation with increasing distance is investigated analytically and numerically. To characterize a stochastic EM field by measurements we have to sense the electromagnetic field in pairs of sampling points and to compute the correlations of all pairs. In the far-field, the field cross correlation functions depend only on the coordinate differences. This yields a considerable reduction of the measurement effort.
Keywords
correlation methods; electric variables measurement; electromagnetic interference; all-pair correlation; electromagnetic interference; field cross correlation functions; measurement effort reduction; near-field scanning; sampling points; stochastic EM field; stochastic electromagnetic fields; transverse correlation evolution; Stochastic electromagnetic fields; electromagnetic interference; near-field scanning; noisy electromagnetic fiefs;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium (IMS), 2015 IEEE MTT-S International
Conference_Location
Phoenix, AZ
Type
conf
DOI
10.1109/MWSYM.2015.7166953
Filename
7166953
Link To Document