Title :
Time-Domain Reflectometry for Near-Field Scanning Microwave Microscopy
Author :
Farina, Marco ; Di Donato, Andrea ; Mencarelli, Davide ; Venanzoni, Giuseppe ; Morini, Antonio ; Pietrangelo, Tiziana
Author_Institution :
Dipt. di Ing. dell´Inf., Univ. Politec. delle Marche, Ancona, Italy
Abstract :
Time-Domain Reflectometry (TDR) is a well-well known technique, widely used in several fields, such as signal integrity and remote sensing. Here we show that TDR can be conveniently used in the Near-Field Scanning Microwave Microscopy, regardless the apparent mismatch between timescales involved at nanoscale and the period of a microwave signal. The technique is demonstrated on Highly Oriented Pyrolitic Graphite (HOPG) and CVD graphene.
Keywords :
chemical vapour deposition; graphene; microwave reflectometry; near-field scanning optical microscopy; pyrolysis; time-domain reflectometry; CVD graphene; HOPG; TDR; highly oriented pyrolitic graphite; microwave signal; near field scanning microwave microscopy; time scale; time-domain reflectometry; Coaxial cables; Finite element analysis; Graphene; Image resolution; Microscopy; Time measurement; Scanning probe microscopy; microwave imaging; reflectometry; tomography;
Conference_Titel :
Microwave Symposium (IMS), 2015 IEEE MTT-S International
Conference_Location :
Phoenix, AZ
DOI :
10.1109/MWSYM.2015.7167015
