Title :
A waveform-shaping millimeter-wave oscillator with 184.7dBc/Hz FOM in 40nm digital CMOS process
Author :
Xun Luo ; Qian, Huizhen Jenny ; Stazewski, Rorbert
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
Abstract :
In this paper, a topology for millimeter-wave (mm-wave) oscillator with a waveform-shaping operation is proposed with improved phase-noise. The 3rd harmonic enhancement for enforcing a pseudo-square voltage waveform and adjustable tuning-banks for wide tuning range are simultaneously achieved, based on a multi-stage broadside-coupled transformer (MSBCT) with reconfigurable coupling factors at mm-wave. Meanwhile, to meet the high-Q, high-resolution, and metal density limits, a novel 3D self-shielded capacitor is developed for implementation of tuning-banks operating at mm-wave. To verify the mechanism of the structures above, a waveform-shaping mm-wave digitally-controlled oscillator (DCO) is fabricated. The proposed oscillator has a state-of-the-art figure-of-merit (FoM) of 184.7dBc/Hz at 58.1 GHz under 110°C, despite being realized in a digital CMOS 40nm process without customary ultra-thick metal option. The resolution for this DCO is about 2.5MHz within the whole tuning range. The chip core size is 315um by 110um.
Keywords :
CMOS digital integrated circuits; capacitors; field effect MIMIC; millimetre wave oscillators; phase noise; transformers; 3D self-shielded capacitor; MSBCT; adjustable tuning-banks; digital CMOS process; digitally-controlled oscillator; frequency 58.1 GHz; harmonic enhancement; millimeter wave oscillator; multistage broadside-coupled transformer; phase noise; pseudosquare voltage waveform; reconfigurable coupling factors; size 40 nm; temperature 110 degC; waveform shaping operation; Indexes; Linearity; Mixers; Oscillators; Signal generators; 3D self-shielded capacitor; digitally-controlled oscillator (DCO); millimeter-wave (mm-wave); multi-stage broadside-coupled transformer (MSBCT); waveform-shaping;
Conference_Titel :
Microwave Symposium (IMS), 2015 IEEE MTT-S International
Conference_Location :
Phoenix, AZ
DOI :
10.1109/MWSYM.2015.7167075