• DocumentCode
    726305
  • Title

    DERA: Yet another differential fault attack on cryptographic devices based on error rate analysis

  • Author

    Yannan Liu ; Jie Zhang ; Lingxiao Wei ; Feng Yuan ; Qiang Xu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Fault-injection attack is a serious threat to the security of cryptographic devices, and various differential fault analysis (DFA) techniques have been presented in the literature over the years. These attacks differ in terms of the underlining assumption on the fault models, the key distinguisher and the complexity of the associated analytical algorithm. In this work, we propose a new DFA technique that uses the inherent bias of the error rates among different signals as the foundation of the key distinguisher design, namely differential error rate analysis (DERA). Compared to existing DFA solutions, DERA is a more efficient and effective attack, in terms of both temporal and spatial needs for the attack, as demonstrated with FPGA emulation in our experiments.
  • Keywords
    circuit reliability; cryptography; error analysis; fault diagnosis; field programmable gate arrays; DERA; DFA techniques; FPGA emulation; associated analytical algorithm; cryptographic devices; differential error rate analysis; differential fault analysis techniques; differential fault attack; fault-injection attack; Circuit faults; Clocks; Complexity theory; Entropy; Error analysis; Field programmable gate arrays; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2744816
  • Filename
    7167215