DocumentCode :
726305
Title :
DERA: Yet another differential fault attack on cryptographic devices based on error rate analysis
Author :
Yannan Liu ; Jie Zhang ; Lingxiao Wei ; Feng Yuan ; Qiang Xu
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
fYear :
2015
fDate :
8-12 June 2015
Firstpage :
1
Lastpage :
6
Abstract :
Fault-injection attack is a serious threat to the security of cryptographic devices, and various differential fault analysis (DFA) techniques have been presented in the literature over the years. These attacks differ in terms of the underlining assumption on the fault models, the key distinguisher and the complexity of the associated analytical algorithm. In this work, we propose a new DFA technique that uses the inherent bias of the error rates among different signals as the foundation of the key distinguisher design, namely differential error rate analysis (DERA). Compared to existing DFA solutions, DERA is a more efficient and effective attack, in terms of both temporal and spatial needs for the attack, as demonstrated with FPGA emulation in our experiments.
Keywords :
circuit reliability; cryptography; error analysis; fault diagnosis; field programmable gate arrays; DERA; DFA techniques; FPGA emulation; associated analytical algorithm; cryptographic devices; differential error rate analysis; differential fault analysis techniques; differential fault attack; fault-injection attack; Circuit faults; Clocks; Complexity theory; Entropy; Error analysis; Field programmable gate arrays; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1145/2744769.2744816
Filename :
7167215
Link To Document :
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