• DocumentCode
    726390
  • Title

    Model-based testing of automotive software: Some challenges and solutions

  • Author

    Petrenko, Alexandre ; Timo, Omer Nguena ; Ramesh, S.

  • Author_Institution
    Comput. Res. Inst. of Montreal, Montreal, QC, Canada
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Automotive software has been growing in size, criticality and complexity with each new generation of vehicles. Testing at the model and code level is an important step in validating the software against various types of defects that may be introduced in the development process. Model based testing (MBT) methodology, paves a road towards automation of testing activities. Test generation is a computationally complex task, which requires efficient constraint solving techniques and some guidance from the test engineer when this task cannot be solved by a tool. At the same time, automatic tools can hardly substitute domain testing experts which can develop more effective tests or at least test fragments than any tool. This is why we believe that future test generation tools should support “tester-in-the-loop” MBT approaches. In this paper, we provide a brief report on our results in this direction.
  • Keywords
    automotive engineering; constraint handling; program testing; program verification; traffic engineering computing; vehicles; MBT methodology; automatic tools; automotive software; code level testing; constraint solving techniques; development process; domain testing; model-based testing; software defects; software validation; test generation tools; tester-in-the-loop; vehicles; Bridges; Computational modeling; Context; Input variables; Prototypes; Software; Testing; Model-based testing; extended state machines; finite state machines; statecharts; test chaining; test generation; test models; test optimization; tester-in-the-loop;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2747935
  • Filename
    7167303