• DocumentCode
    726436
  • Title

    TA-FTA: Transition-aware functional timing analysis with a four-valued encoding

  • Author

    Chang, Jasper C. C. ; Huang, Ryan H.-M ; Lin, Louis Y.-Z ; Wen, Charles H.-P

  • Author_Institution
    Dept. of Elec. Comp. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    8-12 June 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Timing analysis becomes profound for modern VLSI designs. Functional timing analysis (FTA) has emerged to eliminate false paths and provide better timing closure than traditional static timing analysis (STA). However, signal transitions effect, such as multiple input switching (MIS), which changes the pin-to-pin delay of a gate as well as the overall circuit delay, has not yet been considered in FTA. Therefore, a Transition-Aware FTA (TA-FTA) engine using a novel four-valued encoding for calculating true delay under the signal-transition effect is developed in this work. However, timing analysis becomes sophisticated once the signal-transition effect is concerned. Therefore, two techniques, cone separation and filtering (CSF) and quadratic dynamic search (QDS), are also proposed to speed up TA-FTA by more than two orders in time. Experimental results shows that after considering the MIS effect, in the benchmark circuits, the delay reported by our TA-FTA increases by 23% on average and by 38% for the worst case.
  • Keywords
    VLSI; encoding; filtering theory; integrated circuit design; logic circuits; logic design; synchronisation; timing; CSF; MIS effect; QDS; STA; TA-FTA engine; VLSI designs; cone separation and filtering; four-valued encoding; multiple input switching; overall circuit delay; pin-to-pin delay; quadratic dynamic search; signal transition effect; static timing analysis; timing closure; transition-aware functional timing analysis; very large scale integration; Benchmark testing; Delays; Encoding; Integrated circuit modeling; Logic gates; Switches; FTA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2015 52nd ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2744769.2744914
  • Filename
    7167351