Title :
Application benefits achieved utilizing IGBT5-based power semiconductors
Author :
Schulz, Martin ; Brieke, Dirk ; Nagarajan, Raghavan ; Zhao, Zhen Bo
Author_Institution :
Infineon Technologies, Warstein, Germany
Abstract :
This paper deals with the thermal aspects that arise from using the next generation of high power semiconductors featuring a maximum operating temperature for the 5th generation IGBT of 175°C. The benefits that arise for the application and the points that need to be considered beyond the semiconductors are evaluated using a hardware demonstrator.
Keywords :
Density measurement; Insulated gate bipolar transistors; Multichip modules; Power system measurements; Soldering; Temperature measurement; Temperature sensors;
Conference_Titel :
Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on
Conference_Location :
Seoul, South Korea
DOI :
10.1109/ICPE.2015.7168026