Title :
A secure design-for-test infrastructure for lifetime security of SoCs
Author :
Backer, Jerry ; Ali, Sk Subidh ; Rosenfeld, Kurt ; Hely, David ; Sinanoglu, Ozgur ; Karri, Ramesh
Author_Institution :
Polytech. Sch. of Eng., New York Univ., New York, NY, USA
Abstract :
Modular design of a system-on-chip (SoC) exposes intellectual property (IP) and SoC assets to attacks in test, debug, and functional modes. We enhance the SoC Design-for-Test (DfT) infrastructure with security countermeasures to thwart these attacks. We first secure IP and SoC assets from attacks in test and debug modes, then reuse the DfT infrastructure to detect attacks in functional mode.
Keywords :
design for testability; industrial property; security of data; system-on-chip; DfT infrastructure; IP assets; SoC assets; debug modes; design-for-test infrastructure; functional modes; intellectual property; lifetime security; modular design; security countermeasures; system-on-chip; test modes; Ciphers; Engines; IP networks; Monitoring; Registers; System-on-chip;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7168564