Title :
A 0.5–30GHz wideband differential CMOS T/R switch with independent bias and leakage cancellation techniques
Author :
Zhang, Xinwang ; Sun, Yichuang ; Wang, Zhihua ; Chi, Baoyong
Author_Institution :
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
Abstract :
A 0.5–30GHz wideband differential CMOS T/R switch is proposed with low insertion loss (IL), high power handling capacity and high TX-RX isolation. The independent bias technique is proposed to keep the transistors in ideal on/off mode to improve IL and power handling capacity. The leakage cancellation technique is introduced to cancel leakage from TX port to RX port with two match paths. The proposed T/R switch has been implemented in 65nm CMOS, and simulation results show that it achieves 1.2/1.9dB IL and 43/31dBm 1-dB compression point (P1dB) in TX/RX mode and 60dB TX-RX isolation over 0.5–30GHz.
Keywords :
CMOS integrated circuits; Logic gates; Resistors; Switches; Switching circuits; Transistors; Wideband; Differential; T/R switch; leakage cancellation; wideband;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon, Portugal
DOI :
10.1109/ISCAS.2015.7168667